Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
Posted Date:
Feb 27, 2026
Mar 06, 2026
Awarded Date:
No Awarded Date
| SetAside Type | ||
| Solicitation ID | Solicitation Title | Solicitation Office |
| W911PT26QA041 | Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY | |
| Synopsis | ||
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This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached. *** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. *** .... Read More |
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| Office Location | Agency Name | Solicitation Base Posting Type |
| DEPARTMENT OF THE ARMY | Combined Synopsis/Solicitation | |
