Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Posted Date:
Apr 06, 2026
Apr 11, 2026
Awarded Date:
Mar 27, 2026
| SetAside Type | ||
| No Set aside used | ||
| Solicitation ID | Solicitation Title | Solicitation Office |
| 1333ND26PNB030039 | Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) | |
| Synopsis | ||
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Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) .... Read More
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| Office Location | Agency Name | Solicitation Base Posting Type |
| NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | AWARD Notice | |
