Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument
Posted Date:
Feb 09, 2026
Feb 23, 2026
Awarded Date:
No Awarded Date
| SetAside Type | ||
| No Set aside used | ||
| Solicitation ID | Solicitation Title | Solicitation Office |
| 1333ND26QNB030053 | Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument | |
| Synopsis | ||
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This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details. .... Read More |
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| Office Location | Agency Name | Solicitation Base Posting Type |
| NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | Combined Synopsis/Solicitation | |
