CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates

Posted Date: Feb 12, 2026
Feb 26, 2026
Awarded Date: No Awarded Date
SetAside Type
Solicitation ID Solicitation Title Solicitation Office
1333ND26QNB030031 CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates
Synopsis

See Combined Synopsis Solicitation_1333ND26QNB030031, Attachment 1 - Statement of Work, and Attachment 2 - Applicable Provisions and Clauses attachments for solicitation details. 

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Office Location Agency Name Solicitation Base Posting Type
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY Combined Synopsis/Solicitation
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