CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates

Posted Date: Apr 15, 2026
Apr 30, 2026
Awarded Date: Apr 15, 2026
SetAside Type
Solicitation ID Solicitation Title Solicitation Office
1333ND26PNB030089 CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates
Synopsis

Contract awarded in accordance with the solicitation evaluation criteria of the proposed item that offerred the best value to the Government. 

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Office Location Agency Name Solicitation Base Posting Type
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY AWARD Notice
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