Atomic Force Microscope for use in a Scanning Electron Microscope
Posted Date:
Feb 10, 2026
Feb 19, 2026
Awarded Date:
No Awarded Date
| SetAside Type | ||
| No Set aside used | ||
| Solicitation ID | Solicitation Title | Solicitation Office |
| 1333ND26QNB030045 | Atomic Force Microscope for use in a Scanning Electron Microscope | |
| Synopsis | ||
|
Please see attached combined synopsis/solicitation. .... Read More |
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| Office Location | Agency Name | Solicitation Base Posting Type |
| NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | Combined Synopsis/Solicitation | |
